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Subhasish Mitra Professor of Electrical Engineering and Computer Science Stanford University ABOUT
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Summary Professor Subhasish Mitra directs the Robust Systems Group in the Department of Electrical Engineering and the Department of Computer Science of Stanford University, where he is the Chambers Faculty Scholar of Engineering. His research interests include robust system design, VLSI design, CAD, validation and test, and emerging nanotechnologies. Prior to joining Stanford, Prof. Mitra was a Principal Engineer at Intel Corporation. He received Ph.D. in Electrical Engineering from Stanford University. Prof. Mitra has co-authored more than 150 technical papers, and invented design and test techniques that have seen wide-spread proliferation in the semiconductor industry. His X-Compact technique for test compression has been used in more than 50 Intel products, and has influenced major CAD tools. The IFRA technology for postsilicon validation, created jointly with his student, was characterized as "a breakthrough" in a Research Highlight in the Communications of the ACM (CACM). His work on the first demonstration of carbon nanotube imperfection-immune VLSI circuits, jointly with his students and collaborators, was selected by the National Science Foundation (NSF) as a Research Highlight to the United States Congress, and was highlighted "as a significant breakthrough" by the Semiconductor Research Corporation (SRC), the MIT Technology Review, and several others. Prof. Mitra's honors include the Presidential Early Career Award for Scientists and Engineers from the White House, the highest honor bestowed by the United States on early-career outstanding scientists and engineers, Terman Fellowship, IEEE CAS/CEDA Donald O. Pederson Award for the best paper published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ACM SIGDA Outstanding New Faculty Award, Intel Divisional Recognition Award "for a breakthrough soft error protection technology," and the Intel Achievement Award, Intel’s highest corporate honor, "for the development and deployment of a breakthrough test compression technology." He and his students presented award-winning papers at several major conferences: IEEE/ACM Design Automation Conference, IEEE VLSI Test Symposium, Symposium on VLSI Technology, IEEE International Test Conference, and the Intel Design and Test Technology Conference. At Stanford, he was honored multiple times by graduating seniors "for being important to them during their time at Stanford." CURRENT INSTITUTION
Stanford University
DEPARTMENT
Electrical Engineering and Computer Science
DISCIPLINES
Physical Sciences: Computer Science Physical Sciences: Engineering: Electrical Engineering
ADDRESS
Gates Building, Room 336 Stanford California 94305 United States Phone: 650-724-1915
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